wizyta

od 2020-09-20

Title: SAS characterization of organic film deposited on porous silicas

Source: Applied Crystallography

Year : 2004

Abstract:

The small angle scattering methods can be used to investigate the density scattering profile at phase boundaries; in the following paper SAXS method was used for the characterization of organic film deposited on porous inorganic carriers. The existence of organic film on the surface of the porous carrier causes the changed in scattering; negative and positive deviations from Porod’s law can occurred. Significant differences in Porod’s plot of hydrated and dehydrated ZrO2 samples coated by bromododecanol were observed. These differences suggest considerable differences in alcohol molecules orientation on the two kinds of surface and confirm that the SAXS method can be used in determination of the structure of organic phase deposited on the porous surface.

DOI: 10.1142/9789812702913_0069   (Pobrane:  2020-10-23)